course 318525

Transmission Electron Microscopy in Materials Science

Technion Graduate Course #318525

Spring Semester, 2021

Room 401, Meidan building & Broadcast using ZOOM

Sylabus

Transmission electron microscopy (TEM) is becoming more and more essential in many fields of research involving nano-scale structures.

The goal of this course is to provide the student with a basis upon which s/he can interpret electron microscopy results, understand the microscopy of others, and to know when (and when not) to turn to electron microscopy for answers concerning the microstructure of materials.

This course attempts to cover the basic topics required in all current microscopy techniques in use, and to delve into some of the more advanced techniques which are used in Materials Science.

The course is based on 13 lectures. In addition, the student is required to complete exercises which will be handed out during the course. A final exam will complete the course.

The final grade will be composed in the following manner:

  • 2 home exercises (50%)
  • 1 final exam (50%)

The lectures will be held on Mondays between 12:30-14:20 at room 401 in the Maydan building (department of Materials Science & Engineering).

Lecturer Details
Dr. Yaron Kauffmann
Phone #: 4567
Office: Electron microscopy center (MIKA) office # EM12
e-mail: mtyaron@technion.ac.il
Recommended Literature
* D.B. Williams and C.B. Carter “Transmission Electron Microscopy” Vol. 1-4, Plenum Press, New York (1996).
* D. Brandon and W.D. Kaplan, “Microstructural Characterization of Materials”, Wiley press, 2nd edition (2008).
* J.W. Edington, “Practical Electron Microscopy in Materials Engineering” (1976).
* J.C.H. Spence, “High-Resolution Electron Microscopy”, Oxford press, 3d edition (2003).
* R.F. Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope”, Springer press, 3d edition (2011).
* Eric Stach, “MSE 640 Transmission Electron Microscopy and Crystalline Imperfections”, http://nanohub.org/resources/4092.

* to obtain a passwd for the PDF files please contact me

#DateTopics (+ lectures slides in flash** - no password needed)Handouts*
122.03.21Introduction / Historical overview / Types of TEMs / Electron sources lecture 1 slides in flash
  • lecture #1
  • 205.04.21Electron optics / Lens aberrations / Resolution / The vacuum system / Sample holders lecture 1 slides in flash
  • lecture #2
  • 312.04.21Electron scattering in materials / Basic crystallography / Electron diffraction lecture 1 slides in flash
  • lecture #3
  • 419.04.21Electron diffraction & the reciprocal space / Solving electron diffractions - exercises and practice lecture 1 slides in flash
  • lecture #4
  • JEMS SE WIN7
  • 526.04.21Electron diffraction - Laue zones / Dynamic diffraction / Kikuchi patterns / CBED /
    Contrast mechanisms - Mass-thickness lecture 1 slides in flash
  • lecture #5
  • 603.05.21Contrast mechanisms - Diffraction contrast / Contrast from planar defects & interfaces lecture 1 slides in flash
  • lecture #6
  • 710.05.21Phase contrast (HRTEM) - Fresnel Contrast / Moiré patterns / Lattice imaging
    Home Assignment #1 - submission date
    824.05.21Phase contrast (HRTEM) & The CTF
    31.05.21No lecture - The 54th Annual meeting of the Israel Society of Microscopy (ISM)
    907.06.21Phase contrast (HRTEM) - Image delocalization / Cs correction / Quantitative analysis of phase contrast images / Phase contrast image simulations / Quantitative image processing & analysis
    1014.06.21Coherent & incoherent imaging / HRSTEM - BF/ADF/HAADF
    11TBADemo at the Titan
    Home Assignment #2 - submission date
    1221.06.21TEM Sample preparation / Electron Energy Loss Spectroscopy (EELS) & Energy Filtered TEM (EFTEM)
    1328.06.21Electron Energy Loss Spectroscopy (EELS) & Energy Filtered TEM (EFTEM) / Energy-dispersive X-ray spectroscopy (EDS) in the TEM
    Final exam

    Comments are closed.